Micrometer guide



Oct. 5 1926.

L. c. WALDEN MICROMETER GUIDE Filed Feb. 26, 1926 A'ITORNEY WITNESS:

Patented Get. 5, 1%.26.

LOWEL c. WALDEN, or NEOG-A, rumors.

M Ioaor/In'risrt GUIDE.

Application filed February 26, 1928. Serial No. 90,869.

This invention relates to an attachment for a micrometer, the general object of the invention being to provide means for supportinganobject while it is being tested by the micrometer, said attachment also acting as a guide for the object. H

Another object of the invention is to make the device adjustable on the micrometer.

This invention also consists in certain other features of construction and in the combination and arrangement of the several parts, to be hereinafter fully described, illus trated in the accompanying drawings and specifically pointed out in the appended claim. 1

In describing my invention in detail, reference will be had to the accompanying drawings wherein like characters denote like or corresponding parts throughout the several views, and in which Figure 1 is an elevation of a micrometer, showing the invention in use.

Figure 2 is a section on line 22 of Figure 1. I

As shown in these views, the attachment is composed of a U-shaped frame 1 which has the outer ends of its limbs provided with the lateral slots 2 for receiving the fastening means 3 which engage the frame A of the micrometer just below the anvil a thereof. Each limb of the frame 1 is formed with an upwardly extending enlargement 4: at its inner end, these enlargement-s forming two parallel edges which will support an object between the anvil a and the spindle a of the micrometer. As will be seen, the frame can be adjusted vertically so as to permit the supporting edges to be placed at the desired position with respect to the anvil and spindle.

This device will increase the accuracy and speed of inspection of objects with the crometer.

In time, the micrometer anvils, get out of square and this is usually due to the chafing of the anvils by the object being inspected. W hen. the micrometer is used by the hours,

the operators hand becomes tired, due to the tension required to hold the object atone point between the anvils, and the object may shift up and down once or twice before it becomes stationary, or it may pass clear through the anvils and hook underneath the anvils, moving the micrometer out of position. In work where production counts, this placing of the object between the anvils, in a days work, amounts to considerable time. With the micrometer guide, all these false moves are eliminated as it prevents the object being inspected from passiiigbeiieatli the anvils, but will cause it to be stopped at the proper point as soon as placed between the anvils.

The operator is required to shift his eyes from the graduations on the micrometer every time he places the'object between the anvils to see that the object is properly placed or does not pass beneath the anvils, and unless one is extremely careful, an incorrect reading may be registered if the anvil is moved before the eye has had ample time to shift back to the graduations. With the micrometer guide, the operator may concentrate all his attention to the reading of the micrometer, because the micrometer guide will stop the object at the proper position.

After a micrometer has been used for some time, the anvils may get out of square and yet have some point of the anvil that checks correct. In such a case, the m1- crometer guide is adjusted so that the object is inspected at the correct point of the anvils. This feature adds considerably to the life of the micrometer as well as insures correct readings at all times.

By using the micrometer guide, the micrometer is almost as practleal as an indicaparts, provided that such changes fall With;-

in the scope of the appended claim.

What I claim is In combination With a micrometer, a U- 5 shaped member having slots in the end portions of its limbs, fastening means passing through the slots and into a portion of the frame of the micrometer, the limbs of the U-shaped frame having at their free ends enlargements Which are arranged one at 10 each side of the space between the anvil and spindle of the micrometer for supporting and guiding an object to be tested by the micrometer.

In testimony whereof I afiiX my signature.

LOWELL o. WALDEN. 

